• DocumentCode
    2873330
  • Title

    A self-consistent approach to substrate current simulation in submicron MOSFETs

  • Author

    Lydia L.So ; Kan, Edwin ; Yu, Zhiping ; Dutton, Robert W.

  • Author_Institution
    Stanford University
  • fYear
    1994
  • fDate
    1994
  • Firstpage
    45664
  • Lastpage
    46759
  • Keywords
    Charge carrier processes; Circuit simulation; Energy loss; Impact ionization; Lattices; MOSFETs; Poisson equations; Predictive models; Spontaneous emission; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
  • Type

    conf

  • DOI
    10.1109/EDMS.1994.771125
  • Filename
    771125
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2873330