DocumentCode :
28734
Title :
Fault Tolerant Parallel Filters Based on Error Correction Codes
Author :
Zhen Gao ; Reviriego, Pedro ; Wen Pan ; Zhan Xu ; Ming Zhao ; Jing Wang ; Maestro, Juan Antonio
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
Volume :
23
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
384
Lastpage :
387
Abstract :
Digital filters are widely used in signal processing and communication systems. In some cases, the reliability of those systems is critical, and fault tolerant filter implementations are needed. Over the years, many techniques that exploit the filters´ structure and properties to achieve fault tolerance have been proposed. As technology scales, it enables more complex systems that incorporate many filters. In those complex systems, it is common that some of the filters operate in parallel, for example, by applying the same filter to different input signals. Recently, a simple technique that exploits the presence of parallel filters to achieve fault tolerance has been presented. In this brief, that idea is generalized to show that parallel filters can be protected using error correction codes (ECCs) in which each filter is the equivalent of a bit in a traditional ECC. This new scheme allows more efficient protection when the number of parallel filters is large. The technique is evaluated using a case study of parallel finite impulse response filters showing the effectiveness in terms of protection and implementation cost.
Keywords :
FIR filters; error correction codes; fault tolerance; reliability; ECCs; communication systems; digital filters; error correction codes; fault tolerant parallel filters; filter structure; parallel finite impulse response filters; signal processing; system reliability; Error correction codes; Fault tolerance; Fault tolerant systems; Finite impulse response filters; Parity check codes; Tunneling magnetoresistance; Very large scale integration; Error correction codes (ECCs); filters; soft errors; soft errors.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2308322
Filename :
6763110
Link To Document :
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