DocumentCode
2873661
Title
High drain current peak-to-valley ratios in strained In0.15Ga0.85As channel real-space transfer transistors
Author
Lai, JiunTsuen ; Joseph Ya-min Lee
fYear
1994
fDate
1994
Firstpage
44625
Lastpage
45721
Keywords
FETs; Fabrication; Gallium arsenide; Indium gallium arsenide; Molecular beam epitaxial growth; Ohmic contacts; Substrates; Temperature; Virtual colonoscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
Type
conf
DOI
10.1109/EDMS.1994.771155
Filename
771155
Link To Document