DocumentCode :
2873789
Title :
Test Vector Generation for Linear Analog Devices
Author :
Tsai, Sheng-Jen
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
592
Keywords :
Band pass filters; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Logic circuits; Logic devices; Logic testing; Quadratic programming; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519722
Filename :
519722
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2873789
