DocumentCode :
2873974
Title :
ON TEST GENERATION FOR IDDQ TESTING OF BRIDGING FAULTS IN CMOS CIRCUITS
Author :
Bollinger, S. Wayne ; Midkiff, Scott F.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
598
Keywords :
CMOS digital integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Semiconductor device modeling; Switching circuits; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519723
Filename :
519723
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2873974
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