• DocumentCode
    2873981
  • Title

    Near infrared intersubband transitions in delta-doped InAs/AlSb multi-quantum wells

  • Author

    Nakai, M. ; Sasa, S. ; Nakajima, Y. ; Furukawa, M. ; Inoue, M. ; Larrabee, D.C. ; Kono, J. ; Li, J. ; Ning, C.Z.

  • Author_Institution
    New Mater. Res. Center, Osaka Inst. of Technol., Japan
  • fYear
    2004
  • fDate
    26-28 July 2004
  • Firstpage
    65
  • Lastpage
    66
  • Abstract
    Recently, the development of a compact light source operating in terahertz (THz) frequency range has attracted great amount of interest. Our goal is to realize all optical light sources pumped by a compact near infrared diode laser. For this purpose, we investigate intersubband transitions (ISBTs) in InAs/AlSb multiple quantum wells (MQWs). The family of semiconductors with a lattice constant of around 6.1 Å (InAs, AlSb, and GaSb) has several advantageous features such as the large conduction band discontinuity of about 2.1 eV and small effective mass in InAs leading to strong ISBTs. Previously, we studied the ISBTs in unintentionally doped InAs/AlSb for relatively wide wells and reported that no ISBTs were observed for well width less than 5 nm. Ohtani et al. reported ISBTs can be observed in narrower (2.7 nm) InAs/AlSb MQWs. In order to observe ISBTs in near infrared region, we investigate heavily doped InAs/AlSb MQWs with the well width, d, less than 5 nm.
  • Keywords
    III-V semiconductors; aluminium compounds; indium compounds; light sources; optical pumping; semiconductor doping; semiconductor lasers; semiconductor quantum wells; submillimetre wave spectra; InAs-AlSb; conduction band discontinuity; multiple quantum wells; near infrared diode laser; near infrared intersubband transitions; optical light sources; optical pump; semiconductor doping; terahertz frequency range; Doping; Gallium arsenide; Lattices; Light sources; Materials science and technology; Molecular beam epitaxial growth; Optical buffering; Quantum well devices; Silicon; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, 2004. International Meeting for
  • Print_ISBN
    0-7803-8423-7
  • Electronic_ISBN
    0-7803-8424-5
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2004.1566410
  • Filename
    1566410