Title :
Lateral field enhanced band-trap-band tunneling current in a 0.5 μm "off" state mosfet
Author :
Wang, Tahui ; Huang, C. ; Chang, T.E. ; Chou, J.W. ; Chang, C.Y.
Author_Institution :
National Chiao Tung University
Keywords :
Charge carrier processes; Electron traps; Hot carriers; Interface states; Laboratories; Leakage current; MOSFET circuits; Stress; Tunneling; Voltage;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.771216
