Fitting Noise Power Spectrum Parameters by Squared Distance Minimization

Author

Lei, Na ; Du, Jiao ; Zhou, Qiuzhan ; Wu, Dane

Author_Institution

Coll. of Math., Jilin Univ., Changchun, China

fYear

2009

fDate

11-13 Dec. 2009

Firstpage

1

Lastpage

4

Abstract

In order to improve the accuracy and stability of conventional least square estimation for noise power spectrum, this paper presents a new method of quantitative calculation which is based on the squared distance minimization (SDM). The amplitudes of each noise can be gained by using this method, and then the reliability estimation of the semiconductor can be realized. The experiment results show that the SDM method is more stable and need less computation than that of the least square method (LSM).

Keywords

least squares approximations; semiconductor device reliability; fitting noise power spectrum parameters; least square estimation; least square method; semiconductor reliability estimation; squared distance minimization; Least squares approximation; Least squares methods; Low-frequency noise; Minimization methods; Noise generators; Noise level; Power system reliability; Semiconductor device noise; Semiconductor device reliability; Semiconductor devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on

Conference_Location

Wuhan

Print_ISBN

978-1-4244-4507-3

Electronic_ISBN

978-1-4244-4507-3

Type

conf

DOI

10.1109/CISE.2009.5366841

Filename

5366841