DocumentCode
2874214
Title
Fabrication of a 35-channel optical scanner integrated by passive-self alignment using through-holes precisely formed by DRIE
Author
Akashi, T. ; Kanamaru, M. ; Kazama, A. ; Itou, Y. ; Horino, M. ; Fukuda, K. ; Ishikawa, T. ; Harada, T. ; Okada, R.
Author_Institution
Mech. Eng. Res. Lab., Hitachi Ltd., Tsuchiura, Japan
fYear
2004
fDate
2004
Firstpage
677
Lastpage
680
Abstract
A 35-channel optical scanner integrating a mirror array and a collimator-lens array was fabricated. The mirror array consists of a mirror substrate with 35 single-axis-rotational mirrors and an electrode substrate for actuating the corresponding mirror by electrostatic force. Each substrate includes two kinds of through-holes: one for passing a collimated-optical beam through, the other for inserting a precise pin for passive-self alignment of the mirror array and the collimator-lens array. To precisely form the through-holes suitable for passive-self alignment, deep reactive ion etching (DRIE) conditions were optimized. DRIE from both surfaces of a substrate under the optimized conditions - a C4F8/SF6 gas-flow ratio of 90% and a bias power in SF6 gas of 110 W - can form through-holes with an average undercut of 3.4 μm and an average sidewall angle of 89.9 degrees. By passive-self alignment, namely, inserting a pin into the fabricated through-hole and stacking the mirror array on the collimator-lens array, the measured assembly deviation of each substrate was less than 17.5 μm.
Keywords
integrated optics; lenses; mirrors; optical fabrication; optical scanners; sputter etching; 110 W; 35-channel optical scanner fabrication; collimated optical beam; collimator lens array; deep reactive ion etching; electrode substrate; electrostatic force; mirror array; mirror substrate; passive self alignment; Assembly; Electrodes; Electrostatics; Etching; Integrated optics; Mirrors; Optical arrays; Optical collimators; Optical device fabrication; Stacking;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
Print_ISBN
0-7803-8265-X
Type
conf
DOI
10.1109/MEMS.2004.1290675
Filename
1290675
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