Title :
High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms
Author :
Chen, Chun-Hung ; Abraham, Jacob A.
Keywords :
CMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Manufacturing; Switching circuits;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519725
