DocumentCode
2874309
Title
Role of boron atoms on fluorine diffusion in pre-amorphized silicon
Author
Tachi, M. ; Tsuji, H. ; Furuhashi, M. ; Taniguchi, K.
Author_Institution
Dept. of Electron. & Inf. Syst., Osaka Univ., Japan
fYear
2004
fDate
26-28 July 2004
Firstpage
101
Lastpage
102
Abstract
Fluorine co-implantation technique has been studied extensively to form ultra-shallow p+n junctions. Many of these studies report the retarded diffusion of fluorine and boron in crystalline silicon, while there are few reports on the interaction of fluorine with boron in amorphous silicon. Recently, Jacques et al. report that fluorine enhances boron diffusion in amorphous silicon (2003). However, the mechanism of the fluorine-enhanced boron diffusion is not clarified yet because fluorine diffusion has not been investigated in detail. The aim of this work is to elucidate the physical mechanism on the interaction of fluorine with boron through the experiments on fluorine diffusion in boron-doped pre-amorphized silicon.
Keywords
amorphous semiconductors; boron; chemical interdiffusion; crystallisation; fluorine; semiconductor doping; semiconductor junctions; B; amorphous silicon; crystalline silicon; fluorine co-implantation technique; p+n junctions; Amorphous materials; Amorphous silicon; Annealing; Atomic measurements; Boron; Crystallization; Doping; Furnaces; Implants; Information systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Future of Electron Devices, 2004. International Meeting for
Print_ISBN
0-7803-8423-7
Electronic_ISBN
0-7803-8424-5
Type
conf
DOI
10.1109/IMFEDK.2004.1566428
Filename
1566428
Link To Document