• DocumentCode
    2874309
  • Title

    Role of boron atoms on fluorine diffusion in pre-amorphized silicon

  • Author

    Tachi, M. ; Tsuji, H. ; Furuhashi, M. ; Taniguchi, K.

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Osaka Univ., Japan
  • fYear
    2004
  • fDate
    26-28 July 2004
  • Firstpage
    101
  • Lastpage
    102
  • Abstract
    Fluorine co-implantation technique has been studied extensively to form ultra-shallow p+n junctions. Many of these studies report the retarded diffusion of fluorine and boron in crystalline silicon, while there are few reports on the interaction of fluorine with boron in amorphous silicon. Recently, Jacques et al. report that fluorine enhances boron diffusion in amorphous silicon (2003). However, the mechanism of the fluorine-enhanced boron diffusion is not clarified yet because fluorine diffusion has not been investigated in detail. The aim of this work is to elucidate the physical mechanism on the interaction of fluorine with boron through the experiments on fluorine diffusion in boron-doped pre-amorphized silicon.
  • Keywords
    amorphous semiconductors; boron; chemical interdiffusion; crystallisation; fluorine; semiconductor doping; semiconductor junctions; B; amorphous silicon; crystalline silicon; fluorine co-implantation technique; p+n junctions; Amorphous materials; Amorphous silicon; Annealing; Atomic measurements; Boron; Crystallization; Doping; Furnaces; Implants; Information systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, 2004. International Meeting for
  • Print_ISBN
    0-7803-8423-7
  • Electronic_ISBN
    0-7803-8424-5
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2004.1566428
  • Filename
    1566428