DocumentCode
2874460
Title
Fault Location with Current Monitoring
Author
Aitken, Robert C.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
623
Keywords
Circuit faults; Circuit testing; Fault diagnosis; Fault location; Hardware; Monitoring; Performance evaluation; Semiconductor device modeling; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519726
Filename
519726
Link To Document