• DocumentCode
    2874478
  • Title

    Alpha-particle-induced soft error rate modeling

  • Author

    Sai-Halasz, G.

  • Author_Institution
    IBM Reasearch Center, Yorktown Heights, NY, USA
  • Volume
    XXV
  • fYear
    1982
  • fDate
    10-12 Feb. 1982
  • Firstpage
    20
  • Lastpage
    21
  • Abstract
    Monte Carlo procedures have been developed to obtain soft error rates (SER). The SER for a 1μm groundrule DRAM, due to alphas enamating from processing materials, shows the prevalence of multiple errors. SER reducing methods, using epi-layers, buried implant layers and Hi-C structures have been evaluated and found to be marginally effective.
  • Keywords
    Circuit simulation; Coatings; Cosmic rays; DRAM chips; Discrete event simulation; Error analysis; Monte Carlo methods; Packaging; Protection; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1982.1156354
  • Filename
    1156354
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2874478