• DocumentCode
    2874535
  • Title

    A new bonding process for polymer micro- and nanostructures based on near-surface degradation

  • Author

    Truckenmüller, R. ; Henzi, P. ; Herrmann, D. ; Saile, V. ; Schomburg, W.K.

  • Author_Institution
    Inst. fur Mikrostrukturtech., Forschungszentrum Karlsruhe GmbH, Germany
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    761
  • Lastpage
    764
  • Abstract
    A new approach to bond polymer micro- and nanostructures has been developed which avoids many problems caused by adhesives, solvents or high temperatures. The new process is based on generating a thin surface layer with a lowered glass transition temperature in a thicker polymer bulk layer with a higher glass transition temperature by near-surface degradation of the thermoplastic polymer. So welding or heat-sealing is possible at low temperatures. Because of the low thermal load, even bulk structures in the range of some few micrometers and with structure details in the submicron range remain dimensionally stable. The new bonding strategy is demonstrated using the example of a process on the basis of photodegradation. Moulded polymethylmethacrylate (PMMA) microchannels and microspectrometer reflective gratings were bonded to PMMA cover plates by ultraviolet irradiation of the joining faces and subsequent welding at low temperatures. With this new process, celluloseacetate film samples were successfully bonded also.
  • Keywords
    bonding processes; glass transition; microfluidics; nanostructured materials; polymer films; polymer structure; seals (stoppers); ultraviolet radiation effects; welding; PMMA; bonding process; celluloseacetate film; glass transition temperature; heat sealing; microspectrometry reflective gratings; photodegradation; polymer microstructures; polymer nanostructures; polymer structures; polymethylmethacrylate microchannels; surface degradation; thermoplastic polymer; ultraviolet irradiation; welding; Bonding processes; Glass; Microchannel; Nanostructures; Polymers; Solvents; Temperature; Thermal degradation; Thermal loading; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
  • Print_ISBN
    0-7803-8265-X
  • Type

    conf

  • DOI
    10.1109/MEMS.2004.1290696
  • Filename
    1290696