• DocumentCode
    2874550
  • Title

    Properties of periodic metasurfaces versus amorphous arrangements at oblique incidence

  • Author

    Albooyeh, M. ; Simovski, C.R. ; Menzel, Cory ; Helgert, Christian ; Kroll, Mark ; Pertsch, Thomas ; Etrich, Christoph ; Rockstuhl, C. ; Kruk, S. ; Decker, Manuel ; Neshev, Dragomir N. ; Kivshar, Yuri S.

  • Author_Institution
    Dept. of Radio, Aalto Univ., Espoo, Finland
  • fYear
    2013
  • fDate
    7-13 July 2013
  • Firstpage
    312
  • Lastpage
    313
  • Abstract
    Electromagnetic properties of resonant metasurfaces are studied in transition from a periodic to an amorphous arrangement of their constituents. Emphasis is put to investigate the response at oblique incidence and for TM polarized light. Our metasurfaces possess both electric and magnetic resonances which makes them to be canonical samples that reflect properties of many metasurfaces. The suggested analytical model explains many if not to say all far-field optical properties that can be observed in resonant metasurfaces. For example, the resonance broadening and damping for the electric mode which contrasts with the persistence of these properties for the magnetic mode in transition from crystalline to the amorphous state can be fully explained. All theoretical predictions are verified with complementary numerical calculations and experimental measurements.
  • Keywords
    electromagnetic metamaterials; magnetic resonance; TM polarized light; amorphous arrangements; amorphous state; crystalline state; electric mode; electric resonances; electromagnetic properties; far-field optical properties; magnetic resonances; metamaterials; oblique incidence; periodic metasurfaces properties; resonance broadening; resonance damping; resonant metasurfaces; Amorphous magnetic materials; Analytical models; Magnetic resonance; Magnetomechanical effects; Metamaterials; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-5315-1
  • Type

    conf

  • DOI
    10.1109/APS.2013.6710817
  • Filename
    6710817