• DocumentCode
    2874555
  • Title

    Session 6 testing and design automation [breaker page]

  • Author

    Hewlett, F.

  • Author_Institution
    Texas Instruments Inc., Dallas, TX, USA
  • Volume
    XXV
  • fYear
    1982
  • fDate
    10-12 Feb. 1982
  • Firstpage
    53
  • Lastpage
    53
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • Keywords
    Testing and design automation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1982.1156359
  • Filename
    1156359
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2874555