• DocumentCode
    2874746
  • Title

    A 5V-only 16K EEPROM utilizing oxynitride dielectrics and EPROM redundancy

  • Author

    Gupta, A. ; Te-Long Chiu ; Chang, M. ; Renninger, A. ; Perlegos, G.

  • Author_Institution
    SEEQ Technology Incorporated, San Jose, CA, USA
  • Volume
    XXV
  • fYear
    1982
  • fDate
    10-12 Feb. 1982
  • Firstpage
    184
  • Lastpage
    185
  • Abstract
    MEMORY DEVICES utilizing EEPROM cells have been widely pursued. In recent years the ability to grow high-quality thin dielectric in the range of lOOA has brought about the development of EEPROM cells which utilize electron tunneling for both program and erase. However, in previous EEPROM designs?? utllmng thea bove approach, an additional 20Vo r higher supply is required for programming which makes it incompatible with future microprocessor systems. This paper will describe an N-channel2K x 8 EEPROM where reading, writing and erasing operations are from a single 5V supply. This is achieved through a low-power cell design utilizing oxynitride tunnel dielectric and through internal charge pump circuitry for voltage multiplication.
  • Keywords
    Breakdown voltage; CMOS technology; Charge pumps; Circuits; Dielectrics; EPROM; Electrons; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1982.1156369
  • Filename
    1156369