DocumentCode :
2874746
Title :
A 5V-only 16K EEPROM utilizing oxynitride dielectrics and EPROM redundancy
Author :
Gupta, A. ; Te-Long Chiu ; Chang, M. ; Renninger, A. ; Perlegos, G.
Author_Institution :
SEEQ Technology Incorporated, San Jose, CA, USA
Volume :
XXV
fYear :
1982
fDate :
10-12 Feb. 1982
Firstpage :
184
Lastpage :
185
Abstract :
MEMORY DEVICES utilizing EEPROM cells have been widely pursued. In recent years the ability to grow high-quality thin dielectric in the range of lOOA has brought about the development of EEPROM cells which utilize electron tunneling for both program and erase. However, in previous EEPROM designs?? utllmng thea bove approach, an additional 20Vo r higher supply is required for programming which makes it incompatible with future microprocessor systems. This paper will describe an N-channel2K x 8 EEPROM where reading, writing and erasing operations are from a single 5V supply. This is achieved through a low-power cell design utilizing oxynitride tunnel dielectric and through internal charge pump circuitry for voltage multiplication.
Keywords :
Breakdown voltage; CMOS technology; Charge pumps; Circuits; Dielectrics; EPROM; Electrons; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1982.1156369
Filename :
1156369
Link To Document :
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