• DocumentCode
    2874829
  • Title

    A new measurement technique for capacitive coupling coefficients and 3-D capacitance characteristics in floating-gate devices

  • Author

    Choi, Woong L. ; Kim, Dae M. ; Choi, I.H.

  • Author_Institution
    Pohang University of Science and Technology
  • fYear
    1994
  • fDate
    1994
  • Firstpage
    46637
  • Lastpage
    11939
  • Keywords
    Capacitance measurement; Capacitance-voltage characteristics; Electric variables measurement; Electronics industry; Geometry; Laboratories; Measurement techniques; Nonvolatile memory; Testing; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
  • Type

    conf

  • DOI
    10.1109/EDMS.1994.771283
  • Filename
    771283
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2874829