DocumentCode
2874910
Title
Achieving Board-Level BIST Using the Boundary-Scan Master
Author
Jarwala, Najmi ; Yau, Chi W.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
649
Keywords
Access protocols; Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Hardware; Logic testing; Packaging; System testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519729
Filename
519729
Link To Document