DocumentCode :
2874933
Title :
Electroreflectance measurements of triple quantum well structures
Author :
Kai, I. ; Morifuji, M. ; Yamaguchi, M. ; Taniguchi, K. ; Hamaguchi, C.
Author_Institution :
Osaka University
fYear :
1994
fDate :
1994
Firstpage :
41917
Lastpage :
43013
Keywords :
Charge carrier processes; Effective mass; Erbium; Gallium arsenide; Optical coupling; Optical devices; Photoluminescence; Resonance; Stationary state; Wave functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
Type :
conf
DOI :
10.1109/EDMS.1994.771289
Filename :
771289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2874933
