DocumentCode
2875409
Title
Effective cooling of integrated circuits using liquid alloy electrowetting
Author
Mohseni, Kamran
Author_Institution
Dept. of Aerosp. Eng. Sci., Colorado Univ., Boulder, CO, USA
fYear
2005
fDate
15-17 March 2005
Firstpage
20
Lastpage
25
Abstract
Electrical modulation of surface tension is proposed for actuation and pumping of discrete droplets of liquid metals/alloys for active heat management of ICs and removal of hot spots on any solid surface. The proposed technique is based on two observations: (i) by using liquid metals or alloys at room temperature heat transfer rate of a cooling system can be enhanced significantly; (ii) electrowetting is an efficient, low power consumption, and low voltage actuation technique for pumping liquids at micro-scales. Preliminary calculations indicate that more than two orders of magnitude increase in heat transfer rate could be achieved by using liquid metals as compared to systems using water. Liquid velocities above 10 cm/s are observed with extremely low pumping power consumption and at low actuation voltage (∼2 V). It is expected that digitized electrowetting can offer a viable cooling strategy to achieve the most important objectives of electronic cooling; i.e. minimization of the maximum substrate temperature and reduction of the substrate temperature gradient and removing substrate hot spots.
Keywords
cooling; integrated circuit packaging; liquid alloys; liquid metals; microactuators; microfluidics; surface tension; thermal management (packaging); wetting; 10 cm/s; 2 V; IC cooling; active thermal management; cooling system heat transfer rate; digitized electrowetting; discrete droplet actuation; droplet pumping; hot spot removal; liquid alloy electrowetting; liquid metal alloy coolant fluid; liquid velocity; low voltage actuation; microsystems; pumping power consumption; surface tension electrical modulation; Electronics cooling; Energy consumption; Heat pumps; Heat transfer; Low voltage; Power system management; Resistance heating; Solids; Surface tension; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-8985-9
Type
conf
DOI
10.1109/STHERM.2005.1412154
Filename
1412154
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