DocumentCode
2875500
Title
AN ALGORITHM TO TEST RAMS FOR PHYSICAL NEIGHBORHOOD PATTERN SENSITIVE FAULTS
Author
Franklin, Manoj ; Saluja, Kewal K.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
675
Keywords
Circuit faults; Circuit testing; Decoding; Fault detection; Integrated circuit interconnections; Logic testing; Random access memory; Read-write memory; Silicon; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519732
Filename
519732
Link To Document