Title :
AN ALGORITHM TO TEST RAMS FOR PHYSICAL NEIGHBORHOOD PATTERN SENSITIVE FAULTS
Author :
Franklin, Manoj ; Saluja, Kewal K.
Keywords :
Circuit faults; Circuit testing; Decoding; Fault detection; Integrated circuit interconnections; Logic testing; Random access memory; Read-write memory; Silicon; Wiring;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519732
