Title :
Base current noise degradation of polysilicon emitter npn bjt during constant-current stress
Author :
Hsu, Tsun Lai ; Gong, Jeng ; Yu, Keh-Yuh ; Sheng, David
Author_Institution :
National Tsing Hua University
Keywords :
Bipolar transistors; Current measurement; Degradation; Electron devices; Hot carrier effects; Integrated circuit noise; Noise generators; Noise measurement; Stress measurement; Voltage;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.771358
