• DocumentCode
    2875547
  • Title

    Reliability testing of silicone-based thermal greases [IC cooling applications]

  • Author

    Gowda, Arun ; Esler, David ; Paisner, Sara N. ; Tonapi, Sandeep ; Nagarkar, Kaustubh ; Srihari, K.

  • Author_Institution
    GE Global Res. Center, Niskayuna, NY, USA
  • fYear
    2005
  • fDate
    15-17 March 2005
  • Firstpage
    64
  • Lastpage
    71
  • Abstract
    Thermal interface materials (TIMs) play a key role in the thermal management of microelectronics by providing a path of low thermal impedance between the heat generating devices and the heat dissipating components (heat spreader/sink). Thermal greases are TIM solutions that are widely utilized in the industry for the cooling of microelectronics. Thermal greases are expected to provide a very low thermal resistance path due to their ability to penetrate into the surface features of heat spreaders/sinks and silicon die. In addition, thermal greases do not require post-processing. However, some of the disadvantages associated with thermal greases are their tendency to "dry-out" and "pump-out" during prolonged periods of operation. These phenomena can drastically reduce the heat dissipation capability of the thermal grease layer. A "perfect" high thermal conductivity and low contact resistance TIM layer may become a voided and cracked layer on exposure to thermal and mechanical stresses. In this research, various tests are explored to determine the ability of thermal greases to deliver a reliable thermal interface, utilizing various thermal grease formulations, different TIM layer geometries, and testing conditions.
  • Keywords
    cooling; filled polymers; greases; heat sinks; integrated circuit packaging; integrated circuit reliability; life testing; thermal management (packaging); thermal resistance; IC cooling; accelerated reliability testing; grease dry-out; grease pump-out; heat dissipation; heat sinks; heat spreaders; low contact resistance TIM layer; low thermal impedance; low thermal resistance; mechanical stresses; microelectronics thermal management; silicone-based thermal greases; thermal grease reliability testing; thermal interface materials; thermal stresses; Application specific integrated circuits; Cooling; Heat sinks; Integrated circuit testing; Microelectronics; Surface resistance; Thermal conductivity; Thermal management; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-8985-9
  • Type

    conf

  • DOI
    10.1109/STHERM.2005.1412160
  • Filename
    1412160