DocumentCode
2875802
Title
A structured method for assessing the maturity of an electronic design process
Author
Rosenthal, Charles W.
Author_Institution
Mentor Graphics Corp., Wilsonville, OR, USA
fYear
1991
fDate
27-31 Oct 1991
Firstpage
242
Lastpage
246
Abstract
The structured assessment technology discussed is a means for characterizing and measuring the performance of electronic design processes. A model of an excellent design process has been constructed from the combined judgments of experienced managers and engineers and from criteria included in development improvement programs. A questionnaire has been designed to inquire about the use of model practices. The responses are used to measure process maturity employing a scale based on the five-step scale developed by the Software Engineering Institute for software design processes. The measurement is used to monitor improvement in the process as changes are made and to compare a process with industry profiles. The assessment was first tested on six projects. Thereafter, consultants have used the assessment on eleven client projects. Using these projects as an indicator of industry practices, it is concluded that there are weaknesses in customer requirements gathering, in customer involvement in development, in training and support of managers and engineers, and in the use of aids for electronic design and component data transfer
Keywords
CAD; design engineering; electronics industry; project engineering; research and development management; software engineering; CAD; R&D management; component data transfer; electronic design process; industry; maturity; model; performance; project development; projects; questionnaire; research; software design; Design engineering; Engineering management; Industrial training; Management training; Monitoring; Process design; Software design; Software engineering; Software measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Technology Management : the New International Language
Conference_Location
Portland, OR
Print_ISBN
0-7803-0161-7
Type
conf
DOI
10.1109/PICMET.1991.183624
Filename
183624
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