Combining diakoptic, VIE-MoM, and SIE-MoM approaches in analysis of dielectric scatterers

A method combining the diakoptic approach with both the volume integral equation (VIE) and the surface integral equation (SIE) approaches is proposed for analysis of dielectric scatterers. The diakoptic method breaks the original problem into smaller and simpler ones and solves them completely independently, using explicit linear relations between coefficients in expansions of equivalent surface currents on boundary surfaces of diakoptic subsystems. The numerical implementation is carried out using a higher order method of moments (MoM). In a numerical model, some diakoptic subsystems are analyzed by the SIE-MoM and some (considerably inhomogeneous) by the VIE-MoM. The VIE-SIE-diakoptics method is validated in an example of a 4×4×1 array of dielectric cubical scatterers.