Title :
BUILT-IN SELF-DIAGNOSTIC READ-ONLY-MEMORIES
Author :
Nagvajara, Prawat ; Karpovsky, Mark G.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design engineering; Error correction; Error correction codes; Feedback; Polynomials; Read only memory;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519734
