Title :
TWO-PATTERN TEST CAPABILITIES OF AUTONOMOUS TPG CIRCUITS
Author :
FURUYA, KIYOSHI ; McCluskey, Edward J.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Design for testability; Electronic equipment testing; Logic testing; Sequential circuits; Test pattern generators;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519735
