Title :
Correlating the channel, substrate, gate and minority-carrier currents in MOSFETs
Author :
Chenming Hu ; Tam, Simon ; Fu-Chieh Hsu ; Ping Ko ; Muller, Rudolf
Author_Institution :
University of California, Berkeley, CA, USA
Abstract :
An evaluation of measured linear and power-law relationships among the channel, substrate and minority-carrier currents, will be reported. The results simplify the visualizing, testing and modeling of hot-electron currents that affect IC performance and reliability.
Keywords :
Circuit optimization; Conductivity; Current measurement; Degradation; EPROM; Electrons; Leakage current; MOSFETs; Marine vehicles; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1983.1156450
