DocumentCode :
2876255
Title :
Modeling of stacked packaging thermal performance in module/system environment
Author :
Tan, Guixiang ; Wu, Yinan
Author_Institution :
Intel Corp, Hudson, MA, USA
fYear :
2005
fDate :
15-17 March 2005
Firstpage :
270
Lastpage :
274
Abstract :
Package thermal performance is determined by package design and its environment in a system. In reality, it is often costly, and sometimes impossible to include all the detailed features of a package into its system thermal management simulation. This is particularly true for stacked packages due to the design complexity. This paper proposes a methodology to realistically model stacked packages by simplifying the detailed package using a compact model with correlated equivalent thermal performance through a design of experiment (DOE) approach. The correlation between the compact model and package detailed model showed a less than 6.5% error under various boundary conditions, and thus becomes a powerful tool for further evaluation and optimization of the package thermal design.
Keywords :
design of experiments; thermal management (packaging); DOE; correlated equivalent thermal performance; design of experiment; modeling; module/system environment; package design; package thermal performance; stacked packaging; thermal management; Boundary conditions; Design optimization; Electronic packaging thermal management; Energy management; Monitoring; Power system modeling; Temperature distribution; Thermal conductivity; Thermal management; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8985-9
Type :
conf
DOI :
10.1109/STHERM.2005.1412191
Filename :
1412191
Link To Document :
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