Title :
Thin-Film Fine-Pattern Technology for LTCC Multilayer Substrates
Author :
Anderson, Brian ; Horio, Shuichi ; Kobayashi, Kyoji ; Tamada, Nobuhiko
Author_Institution :
Koa Speer Electron., Bradford
fDate :
May 29 2007-June 1 2007
Abstract :
The ability to create fine-pattern line widths on LTCC technology substrates, which can be used for high-temperature and high-frequency applications, has been restricted by the limitations of the existing thick-film technology to a practical level of approximately 60 mum line widths; other technologies for finer line widths and spacings are, as yet, experimental in nature. In this study, the use of a thin-film process, which is already used in the mass production of electronic components, is evaluated for use as a fine surface-layer pattern in line widths as small as 15 mum. Such a technology is possible and appropriate when due attention is paid to the chemistry of the process, the use of low-halogen insulation materials, the use of uniform processes, and appropriate washing methods.
Keywords :
ceramic packaging; multilayers; substrates; thin films; LTCC multilayer substrates; LTCC technology substrate; electronic component; fine surface-layer pattern; low-halogen insulation materials; mass production; thin-film fine-pattern technology; Ceramics; Circuits; Conducting materials; Dielectric loss measurement; Dielectric materials; Dielectric substrates; Frequency; Nonhomogeneous media; Temperature; Transistors;
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2007.373777