• DocumentCode
    2876579
  • Title

    ARTEST: AN ARCHITECTURAL LEVEL TEST GENERATOR FOR DATA PATH FAULTS AND CONTROL FAULTS

  • Author

    Lee, Jaushin ; Patel, Janak H.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    729
  • Keywords
    Automatic test pattern generation; Circuit faults; Circuit synthesis; Circuit testing; Control systems; High performance computing; Libraries; Sequential analysis; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519738
  • Filename
    519738
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2876579