DocumentCode
2876898
Title
Nano-Scale Mechanical Responses of Sn-Ag Based Lead-free Solders
Author
Gao, Feng ; Nishikawa, Hiroshi ; Takemoto, Tadashi
Author_Institution
Osaka Univ., Osaka
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
205
Lastpage
210
Abstract
The mechanical properties of the Sn-3.5Ag lead-free solder alloys were characterized in different size scales by nanoindentation technology. Some of the principle mechanical properties, such as Mayer´s hardness, reduced Young´s modulus and the strain rate sensitivity index were assessed. In particular, the strain rate sensitivity index is extracted from the creep deformation of the solder alloys at the dwell time of target load based on the Miyo-Nix method. It was found that the mechanical properties of the Sn-3.5Ag solder alloy were indeed size dependent. That is, the micro-scale BGA balls showed different mechanical properties from the conventional bulk specimens. According to the strain gradient theory, the non-homogeneous microstructure of the Sn-3.5Ag alloy may be responsible for the creep deformation variation of the micro-scale BGA solder balls. In addition, the influence of aging on the mechanical properties was also discussed.
Keywords
ball grid arrays; creep; nanoelectronics; silver alloys; solders; strain ageing; tin alloys; Miyo-Nix method; SnAg; ageing; creep deformation; dwell time; lead-free solders; microscale BGA balls; nanoindentation technology; nanoscale mechanical response; strain gradient theory; strain rate sensitivity index; Aging; Capacitive sensors; Creep; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Isothermal processes; Lead; Material storage; Mechanical factors; Microstructure;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373799
Filename
4249885
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