DocumentCode
2876973
Title
Test Propagation Through Modules and Circuits
Author
Murray, Brian T. ; Hayes, John P.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
748
Keywords
Circuit faults; Circuit simulation; Circuit testing; Computer science; Design for testability; High level synthesis; Laboratories; Libraries; Microprocessors; VHF circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519740
Filename
519740
Link To Document