Title : 
FAST SIGNATURE COMPUTATION FOR LINEAR COMPACTORS
         
        
            Author : 
Lambidonis, D. ; Ivanov, A. ; Agarwal, V.K.
         
        
        
        
        
            Keywords : 
Application software; Built-in self-test; Central Processing Unit; Circuit faults; Circuit simulation; Compaction; Computational modeling; Laboratories; Testing; Very large scale integration;
         
        
        
        
            Conference_Titel : 
Test Conference, 1991, Proceedings., International
         
        
        
            Print_ISBN : 
0-8186-9156-5
         
        
        
            DOI : 
10.1109/TEST.1991.519746