Title :
Aliasing and Diagnosis Probability in MISR and STUMPS Using a General Error Model
Author :
Karpovsky, Mark G. ; Gupta, Sandeep K. ; Pradhan, Dhiraj K.
Keywords :
Circuit faults; Circuit testing; Codes; Computer errors; DH-HEMTs; Dictionaries; Educational institutions; Fault diagnosis; Feedback; Polynomials;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519748
