Aliasing and Diagnosis Probability in MISR and STUMPS Using a General Error Model

Author

Karpovsky, Mark G. ; Gupta, Sandeep K. ; Pradhan, Dhiraj K.

fYear

1991

fDate

26-30 Oct 1991

Firstpage

828

Keywords

Circuit faults; Circuit testing; Codes; Computer errors; DH-HEMTs; Dictionaries; Educational institutions; Fault diagnosis; Feedback; Polynomials;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1991, Proceedings., International

ISSN

1089-3539

Print_ISBN

0-8186-9156-5

Type

DOI

10.1109/TEST.1991.519748

Filename

519748

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