DocumentCode
2877295
Title
Looking for Functional Fault Equivalence
Author
Lioy, A.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
858
Keywords
Automatic testing; Boolean functions; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Fault diagnosis; Sequential analysis; Target recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519751
Filename
519751
Link To Document