• DocumentCode
    2877390
  • Title

    Impact Performance of Microvia and Buildup Layer Materials and Its Contribution to Drop Test Failures

  • Author

    Xie, Dongji ; Wang, Jonathan ; Yu, Him ; Lau, Dennis ; Shangguan, Dongkai

  • Author_Institution
    Flextronics Int., San Jose
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    391
  • Lastpage
    399
  • Abstract
    This paper introduced a new method to investigate the fracture dynamic response of the PCB materials. Ball impact is used to evaluate the performance of PCB laminate and prepreg materials. Various PCB materials and microvia structures are evaluated which compares halogen free (HF) vs. non-HF, and leadfree compatible vs. non-leadfree compatible, and RCC (resin coated) vs. laser drillable prepreg. It is found that pad cratering including cracking of buildup layer and copper pad delamination are effectively screened out by the impact test. Opportunity or severity of cracking and delamination are dependent to the impact energy and as well as materials of PCB. Materials especially halogen free (HF) and non-filler buildup layers are much more tendency to crack.
  • Keywords
    delamination; fracture toughness testing; impact testing; laminates; printed circuits; PCB laminate; PCB materials; ball impact; copper pad delamination; fracture dynamic response; halogen free buildup layers; impact energy; impact test; microvia layer materials; nonfiller buildup layers; pad cratering; prepreg materials; Chip scale packaging; Delamination; Electronic equipment testing; Hafnium; Laminates; Lead; Materials testing; Optical materials; Performance evaluation; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373827
  • Filename
    4249913