DocumentCode
2877390
Title
Impact Performance of Microvia and Buildup Layer Materials and Its Contribution to Drop Test Failures
Author
Xie, Dongji ; Wang, Jonathan ; Yu, Him ; Lau, Dennis ; Shangguan, Dongkai
Author_Institution
Flextronics Int., San Jose
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
391
Lastpage
399
Abstract
This paper introduced a new method to investigate the fracture dynamic response of the PCB materials. Ball impact is used to evaluate the performance of PCB laminate and prepreg materials. Various PCB materials and microvia structures are evaluated which compares halogen free (HF) vs. non-HF, and leadfree compatible vs. non-leadfree compatible, and RCC (resin coated) vs. laser drillable prepreg. It is found that pad cratering including cracking of buildup layer and copper pad delamination are effectively screened out by the impact test. Opportunity or severity of cracking and delamination are dependent to the impact energy and as well as materials of PCB. Materials especially halogen free (HF) and non-filler buildup layers are much more tendency to crack.
Keywords
delamination; fracture toughness testing; impact testing; laminates; printed circuits; PCB laminate; PCB materials; ball impact; copper pad delamination; fracture dynamic response; halogen free buildup layers; impact energy; impact test; microvia layer materials; nonfiller buildup layers; pad cratering; prepreg materials; Chip scale packaging; Delamination; Electronic equipment testing; Hafnium; Laminates; Lead; Materials testing; Optical materials; Performance evaluation; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373827
Filename
4249913
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