• DocumentCode
    2877471
  • Title

    Low Temperature Transfer of Aligned Carbon Nanotube Films Using Liftoff Technique

  • Author

    Chai, Yang ; Gong, Jingfeng ; Zhang, Kai ; Chan, Philip C.H. ; Yuen, Matthrew M F

  • Author_Institution
    Hong Kong Univ. of Sci. & Technol., Kowloon
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    429
  • Lastpage
    434
  • Abstract
    Carbon nanotubes (CNT) have been proposed for many electronic applications, such as field emitter, diode, transistors, integrated circuit interconnections and thermal interface material (TIM). The growth temperature of high quality CNT typically takes place at high temperatures. The high growth temperature causes significant difficulty in the integration of CNT to the many common material used in electronics, such as, metal, glasses and most polymers. We prepare the high-density aligned CNT film on the silicon/silicon dioxide substrate using a plasma-enhanced chemical vapor deposition (PECVD) method. The aligned CNT film is kept intact after the supporting silicon dioxide layer is removed by hydrofluoric acid (HF) solution. The "lifted off" CNT film can be transferred to various substrates at room temperature. This method avoids the problem caused by the high temperature process, and retains the CNT film quality. Thermal characterization indicates that the resistance of the transferred CNT film is comparable with that of as-grown CNT film. This method can be extended to many electronic applications, such as the fabrication of the field emitter, integrated circuit interconnect and sensors, that require CNT synthesis temperatures not compatible with the substrate material.
  • Keywords
    carbon nanotubes; plasma CVD; thin films; C; carbon nanotube films; field emitter; hydrofluoric acid solution; liftoff technique; plasma-enhanced chemical vapor deposition; thermal characterization; Carbon nanotubes; Diodes; Integrated circuit interconnections; Integrated circuit synthesis; Plasma temperature; Semiconductor films; Silicon compounds; Substrates; Temperature sensors; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373832
  • Filename
    4249918