Output glitches and nonmonotonicity have been eliminated in a fast N-bit DAC, through the use of identical sequentially-switched NMOS current sources. A 2-D series decoding structure minimizes chip area, while insuring that sources switch in sequence.
Keywords :
Analog-digital conversion; Circuit testing; Data acquisition; Decoding; Delay; Fault location; MOS devices; Solid state circuits; Thin film circuits; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International