DocumentCode :
2877496
Title :
MULTIPLE-FAULT SIMULATION AND COVERAGE OF DETERMINISTIC SINGLE-FAULT TEST SETS
Author :
Kubiak, Ken ; Fuchs, W. Kent
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
956
Keywords :
Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Electrical fault detection; Fault detection; Performance evaluation; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519761
Filename :
519761
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2877496
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