DocumentCode :
2877589
Title :
Integrating Emulation Techniques Into General Purpose ATE
Author :
Williams, R. Wade
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
994
Keywords :
Circuit faults; Circuit testing; Emulation; Hardware; Microprocessors; Random access memory; Signal processing; Software testing; System testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519766
Filename :
519766
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2877589
