DocumentCode
2877589
Title
Integrating Emulation Techniques Into General Purpose ATE
Author
Williams, R. Wade
fYear
1991
fDate
26-30 Oct 1991
Firstpage
994
Keywords
Circuit faults; Circuit testing; Emulation; Hardware; Microprocessors; Random access memory; Signal processing; Software testing; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519766
Filename
519766
Link To Document