Title :
ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER
Author :
Karube, Koji ; Bessho, Yoshiyuki ; Takakura, Tokuo ; Gunji, Keita
Keywords :
Circuit testing; Digital signal processing; Digital signal processing chips; Digital signal processors; Frequency; Hardware; ISDN; Modems; Performance evaluation; Signal generators;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519774