• DocumentCode
    2877739
  • Title

    PROGRAMMING FOR PARALLEL PATTERN GENERATORS

  • Author

    Kanzaki, M. ; Ishida, M.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    1061
  • Keywords
    Circuit testing; Computer languages; Hardware; Integrated circuit testing; Parallel programming; Random access memory; Read-write memory; Software design; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519775
  • Filename
    519775
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2877739