Title :
HIGH FREQUENCY WAFER PROBING AND POWER SUPPLY RESONANCE EFFECTS
Author :
Athan, S.P. ; Keezer, D.C. ; McKinley, J.
Keywords :
Blades; Capacitors; Ceramics; Frequency; Power supplies; Predictive models; Probes; Resonance; Semiconductor device modeling; Testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519776
