Title :
Degradation model of LED based on accelerated life test
Author :
Jang, Je Wook ; Choi, Seung Yoon ; Son, Joong Kon
Author_Institution :
Samsung LED Co.Ltd., Suwon, South Korea
Abstract :
ALT(accelerated life test) is a right choice to predict the lifetime of LED lighting source that is expected to have much longer lifetime than the conventional lighting sources. Middle power light-emitting diode (LED) accelerated life tests(ALT) were carried out by two kind of test methods (LED PKG level ALT and LED PKG component (chip, phosphor, premold) level ALT). The predicted curve by using component ALT model contained an inflection point caused by degradation characteristics of PKG component (premold). Therefore, we expect that component accelerated model is more accurate and more logical than simple extrapolation methods as used by LM80 and TM21.
Keywords :
life testing; light emitting diodes; LED PKG level; LED lighting source lifetime; accelerated life test; component accelerated model; degradation model; predicted curve; Acceleration; Degradation; Life estimation; Light emitting diodes; Phosphors; Predictive models; Temperature measurement;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the
Conference_Location :
Incheon
Print_ISBN :
978-1-4577-0159-7
Electronic_ISBN :
1946-1542
DOI :
10.1109/IPFA.2011.5992771
