DocumentCode
2877999
Title
Wafer Level Thin Film Encapsulation for BAW RF MEMS
Author
Pornin, J.L. ; Gillot, C. ; Parat, G. ; Jacquet, F. ; Lagoutte, E. ; Sillon, N. ; Poupon, G. ; Dumont, F.
Author_Institution
CEA-LETI, Grenoble
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
605
Lastpage
609
Abstract
The BAW (Bulk acoustic Wave) RF filters that are used in mobile phone application are composed of pair of piezo electrical resonators which need an air gap above them to operate. This air gap consists of a cavity defined by a dielectric layer which is above each resonator. The size of this cavity is smaller than 200 mum square and less than 5 mum high. The process that has been developed to produce this uses conventional I.C. manufacturing technologies at wafer level with only three photolithography steps. The main advantages of this process are that it provides an area efficient process for high volume, and low cost production which results in high reliability. To summarise the results from this work, BAW filters have been exposed to such steps as: Lead free bumping, back side wafer grinding (to thickness of 150 mum), die sawing, pick and place, flip chip, and plastic encapsulation (over moulding) after under filling and have not been damaged in any part of the process. . The resonance frequency of the BAW filter was not affected by either thin film or back end packaging.
Keywords
acoustic filters; air gaps; bulk acoustic wave devices; micromechanical devices; thin film devices; wafer level packaging; BAW RF MEMS; air gap; back side wafer grinding; bulk acoustic wave; dielectric layer; lead free bumping; manufacturing technologies; mobile phone application; piezoelectrical resonators; resonance frequency; wafer level thin film encapsulation; Acoustic waves; Dielectric thin films; Encapsulation; Lithography; Manufacturing processes; Mobile handsets; Radio frequency; Radiofrequency microelectromechanical systems; Resonator filters; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373858
Filename
4249944
Link To Document