• DocumentCode
    2877999
  • Title

    Wafer Level Thin Film Encapsulation for BAW RF MEMS

  • Author

    Pornin, J.L. ; Gillot, C. ; Parat, G. ; Jacquet, F. ; Lagoutte, E. ; Sillon, N. ; Poupon, G. ; Dumont, F.

  • Author_Institution
    CEA-LETI, Grenoble
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    605
  • Lastpage
    609
  • Abstract
    The BAW (Bulk acoustic Wave) RF filters that are used in mobile phone application are composed of pair of piezo electrical resonators which need an air gap above them to operate. This air gap consists of a cavity defined by a dielectric layer which is above each resonator. The size of this cavity is smaller than 200 mum square and less than 5 mum high. The process that has been developed to produce this uses conventional I.C. manufacturing technologies at wafer level with only three photolithography steps. The main advantages of this process are that it provides an area efficient process for high volume, and low cost production which results in high reliability. To summarise the results from this work, BAW filters have been exposed to such steps as: Lead free bumping, back side wafer grinding (to thickness of 150 mum), die sawing, pick and place, flip chip, and plastic encapsulation (over moulding) after under filling and have not been damaged in any part of the process. . The resonance frequency of the BAW filter was not affected by either thin film or back end packaging.
  • Keywords
    acoustic filters; air gaps; bulk acoustic wave devices; micromechanical devices; thin film devices; wafer level packaging; BAW RF MEMS; air gap; back side wafer grinding; bulk acoustic wave; dielectric layer; lead free bumping; manufacturing technologies; mobile phone application; piezoelectrical resonators; resonance frequency; wafer level thin film encapsulation; Acoustic waves; Dielectric thin films; Encapsulation; Lithography; Manufacturing processes; Mobile handsets; Radio frequency; Radiofrequency microelectromechanical systems; Resonator filters; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373858
  • Filename
    4249944