مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2878002

Title :

IS BURN-IN BURNED OUT?

Author :

Donlin, Noel E.

fYear :

1991

fDate :

26-30 Oct 1991

Firstpage :

1114

Keywords :

Acceleration; Aging; Costs; Failure analysis; Production; Semiconductor device reliability; Semiconductor devices; Steady-state; Stress; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1991, Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-8186-9156-5

Type :

conf

DOI :

10.1109/TEST.1991.519789

Filename :

519789

Link To Document :