DocumentCode :
2878362
Title :
Platform of 3D Package Integration
Author :
Wang, Wei Chung ; Lee, Fred ; Weng, GL ; Tai, Willie ; Ju, Michael ; Chuang, Ron ; Fang, Weileun
Author_Institution :
Adv. Semicond. Eng. Inc., Kaohsiung
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
743
Lastpage :
747
Abstract :
Package on package (PoP) is a package technology placing one package on top of another to integrate different functionalities while still remains a compact size. PoP offers procurement flexibility, lower cost of ownership, better total system costs and faster time to market. Normally designers use top package for memory application and bottom package for ASIC, Baseband or Processor application. By using this PoP technology, the memory KGD issue can be mitigated since the memory to be integrated with bottom package can be burn-in and tested before integration with bottom package. In addition; the development cycle time and cost can be reduced since memory is decoupled from ASIC/Baseband/Processor from the perspective of qualification, yield, sourcing, procurement timing and logistic handling. However, stringent coplanarity control for bottom package is necessary to ensure high package stacking yield when combining with top packages that are normally coming from different sources with different warpage behavior. Besides, the customized mold chase fabrication is costly and time consuming for product prototyping. A state-of-the-art 3D package integration platform based on current FBGA infrastructure had been proposed, developed and validated to resolve the issues listed above and yet is complied with JEDEC package outline standard for PoP.
Keywords :
electronics packaging; 3D package integration; JEDEC package outline standard; memory KGD; package on package; package stacking; Application specific integrated circuits; Baseband; Costs; Logistics; Packaging; Procurement; Qualifications; Testing; Time to market; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.373880
Filename :
4249966
Link To Document :
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