• DocumentCode
    2878369
  • Title

    Fitting a two-component scattering model to polarimetric SAR data

  • Author

    Freeman, A.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    5
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2649
  • Abstract
    Classification, decomposition and modeling of polarimetric SAR data has received a great deal of attention in the literature. The objective behind these efforts is to better understand the scattering mechanisms which give rise to the polarimetric signatures seen in SAR image data. The author describes an approach which involves the fit of a combination of two simple scattering mechanisms to polarimetric SAR observations. The mechanisms are canopy scatter from a cloud of randomly oriented oblate spheroids, and a ground scatter term, which can represent double-bounce scatter from a pair of orthogonal surfaces with different dielectric constants or Bragg scatter from a moderately rough surface, seen through a layer of vertically oriented scatterers. An advantage of this model fit approach is that the scattering contributions from the two basic scattering mechanisms can be estimated for clusters of pixels in polarimetric SAR images. The solution involves the estimation of four parameters from four separate equations. The model fit can be applied to polarimetric AIRSAR data at C-, L- and P-band
  • Keywords
    electromagnetic wave scattering; radar imaging; radar polarimetry; radar theory; synthetic aperture radar; vegetation mapping; Bragg scatter; C-band; L-band; P-band; SAR image data; canopy scatter; classification; decomposition; dielectric constants; double-bounce scatter; ground scatter; modelling; polarimetric AIRSAR data; polarimetric SAR data; randomly oriented oblate spheroids; rough surface; scattering mechanisms; two-component scattering model fitting; vertically oriented scatterers; Backscatter; Clouds; Covariance matrix; Equations; Propagation delay; Radar scattering; Reflection; Rough surfaces; Surface fitting; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
  • Conference_Location
    Hamburg
  • Print_ISBN
    0-7803-5207-6
  • Type

    conf

  • DOI
    10.1109/IGARSS.1999.771605
  • Filename
    771605